A zircon LA-ICPMS reverse depth profiling analysis method and its geological application-Reference-Cited by-同舟云学术

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A zircon LA-ICPMS reverse depth profiling analysis method and its geological application

Published:2024 Issue:3 Volume:39 Page:829-840
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Lu Yao¹,Zhang Liang-Liang¹^ORCID,Liu Li¹,Zhu Di-Cheng¹,Xie Jin-Cheng¹^ORCID,Wang Qing²

Affiliation:

1. State Key Laboratory of Geological Processes and Mineral Resources, Institute of Earth Sciences, China University of Geosciences, Beijing, Beijing, 100083, China

2. State Key Laboratory of Geological Processes and Mineral Resources, School of Earth Science and Resources, China University of Geosciences, Beijing, Beijing, 100083, China

Abstract

A new LA-ICPMS analysis method for zircon U–Pb age and trace element composition and its geological application.

Funder

National Natural Science Foundation of China

Publisher

Royal Society of Chemistry (RSC)

Link

http://pubs.rsc.org/en/content/articlepdf/2024/JA/D3JA00309D

Reference54 articles.

1. Pb, U and Th diffusion in natural zircon

2. Pb diffusion in zircon

3. Diffusion in Zircon

4. Atlas of Zircon Textures

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