Nanoscale chemical characterization of materials and interfaces by tip-enhanced Raman spectroscopy-Reference-Cited by-同舟云学术

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Nanoscale chemical characterization of materials and interfaces by tip-enhanced Raman spectroscopy

Published:2024 Issue: Volume: Page:
ISSN:0306-0012
Container-title:Chemical Society Reviews
language:en
Short-container-title:Chem. Soc. Rev.

Author:

Bao Yi-Fan¹,Zhu Meng-Yuan¹,Zhao Xiao-Jiao¹,Chen Hong-Xuan¹,Wang Xiang¹²,Ren Bin¹²^ORCID

Affiliation:

1. Collaborative Innovation Center of Chemistry for Energy Materials, State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China

2. Innovation Laboratory for Sciences and Technologies of Energy Materials of Fujian Province (IKKEM), Xiamen 361005, China

Abstract

This review presents a detailed discussion on the recent theoretical understanding and technical improvements of tip-enhanced Raman spectroscopy (TERS), and summarizes recent advances of TERS in studying materials and interfaces.

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Publisher

Royal Society of Chemistry (RSC)

Link

http://pubs.rsc.org/en/content/articlepdf/2024/CS/D4CS00588K

Reference346 articles.

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3. Colloidal quantum dot electronics

4. Revealing the nature of active sites in electrocatalysis

5. Correlative operando microscopy of oxygen evolution electrocatalysts

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