Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors
Author:
Affiliation:
1. Electrical and Computer Engineering
2. National University of Singapore
3. , Singapore
4. Excelitas Technologies
Abstract
In this study, nanometer-thick poly-Si shows its impressively low thermal conductivity due to strong phonon-boundary scattering, demonstrating great potential for application in thermoelectric devices.
Publisher
Royal Society of Chemistry (RSC)
Subject
General Materials Science
Link
http://pubs.rsc.org/en/content/articlepdf/2015/NR/C4NR04184D
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