Morphology of X-ray detector Cs2TeI6 perovskite thick films grown by electrospray method-Reference-Cited by-同舟云学术

Morphology of X-ray detector Cs2TeI6 perovskite thick films grown by electrospray method

Published:2019 Issue:28 Volume:7 Page:8712-8719
ISSN:2050-7526
Container-title:Journal of Materials Chemistry C
language:en
Short-container-title:J. Mater. Chem. C

Author:

Guo Jun¹²³⁴⁵^ORCID,Xu Yadong¹²³⁴⁵^ORCID,Yang Wenhui¹²³⁴⁵,Zhang Binbin¹²³⁴⁵,Dong Jiangpeng¹²³⁴⁵,Jie Wanqi¹²³⁴⁵,Kanatzidis Mercouri G.⁶⁷⁸⁹

Affiliation:

1. Key Laboratory of Radiation Detection Materials and Devices

2. Ministry of Industry and Information Technology

3. School of Materials Science and Engineering & State Key Laboratory of Solidification Processing

4. Northwestern Polytechnical University

5. Xi'an

6. Department of Chemistry

7. Northwestern University

8. Evanston

9. USA

Abstract

For the purpose of developing Cs₂TeI₆ based X-ray detectors and imaging devices, Cs₂TeI₆ thick films were prepared using the electrospray method under ambient conditions.

Funder

National Natural Science Foundation of China

National Basic Research Program of China

Fundamental Research Funds for the Central Universities

U.S. Department of Homeland Security

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2019/TC/C9TC02022E

Reference44 articles.

1. Near-infrared imaging with quantum-dot-sensitized organic photodiodes

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5. Compositional engineering of perovskite materials for high-performance solar cells

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