Evaluation of Electrothermal Vaporization, Emission Intensity–Time–Wavelength Measurement and Time Resolution Combined With an Axially Viewed Horizontal Inductively Coupled Plasma Using an Echelle Spectrometer With Wavelength Modulation-Reference-Cited by-同舟云学术

Evaluation of Electrothermal Vaporization, Emission Intensity–Time–Wavelength Measurement and Time Resolution Combined With an Axially Viewed Horizontal Inductively Coupled Plasma Using an Echelle Spectrometer With Wavelength Modulation

Published:1997 Issue:3 Volume:12 Page:349-354
ISSN:0267-9477
Container-title:J. Anal. At. Spectrom.
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

NAKAMURA YOSHISUKE,TAKAHASHI KATSUYUKI,KUJIRAI OSAMU,OKOCHI HARUNO

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/1997/JA/A605453F

Reference24 articles.

1. Evaluation of the Axially Viewed (End-on) Inductively Coupled Argon Plasma Source for Atomic Emission Spectroscopy

2. Analytical performance of the axially viewed inductively coupled plasma generated with a water-cooled torch

3. End-on observation of a horizontal low-flow inductively coupled plasma

4. Evaluation of an axially and radially viewed inductively coupled plasma using an échelle spectrometer with wavelength modulation and second-derivative detection

5. Sample Introduction: The Achilles' Heel of Atomic Spectroscopy?

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