Intriguing interfacial characteristics of the CS contact with MX<sub>2</sub> (M = Mo, W; X = S, Se, Te) and MXY ((X ≠ Y) = S, Se, Te) monolayers-Reference-Cited by-同舟云学术

Intriguing interfacial characteristics of the CS contact with MX₂ (M = Mo, W; X = S, Se, Te) and MXY ((X ≠ Y) = S, Se, Te) monolayers

Published:2022 Issue:20 Volume:12 Page:12292-12302
ISSN:2046-2069
Container-title:RSC Advances
language:en
Short-container-title:RSC Adv.

Author:

Khan H.¹,Ashraf M. U.¹,Idrees M.¹,Din H. U.²,Nguyen Chuong V.³^ORCID,Amin B.¹^ORCID

Affiliation:

1. Department of Physics, Abbottabad University of Science & Technology, Abbottabad, 22010, Pakistan

2. Department of Physics, Bacha Khan University, Charsadda, 24420, Pakistan

3. Department of Materials Science and Engineering, Le Quy Don Technical University, Hanoi 100000, Vietnam

Abstract

Electronic band structure, type of Schottky contact and Schottky barrier height established at the interface of the CS–MX2 (M = Mo, W; X = S, Se, Te) and CS–MXY ((X ≠ Y) = S, Se, Te) MS vdWH.

Funder

University of Malakand

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2022/RA/D2RA00668E

Reference94 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Optical Transitions in Single-Wall Boron Nitride Nanotubes

3. MoS2 Nanoribbons: High Stability and Unusual Electronic and Magnetic Properties

4. Two-Dimensional Nanocrystals Produced by Exfoliation of Ti3AlC2

5. Silicene: Compelling Experimental Evidence for Graphenelike Two-Dimensional Silicon

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