Lateral ion migration accelerates degradation in halide perovskite devices-Reference-Cited by-同舟云学术

Lateral ion migration accelerates degradation in halide perovskite devices

Published:2022 Issue:12 Volume:15 Page:5324-5339
ISSN:1754-5692
Container-title:Energy & Environmental Science
language:en
Short-container-title:Energy Environ. Sci.

Author:

Jacobs Daniel A.¹^ORCID,Wolff Christian M.¹,Chin Xin-Yu²,Artuk Kerem¹,Ballif Christophe¹²,Jeangros Quentin²

Affiliation:

1. Ecole Polytechnique Fédérale de Lausanne (EPFL), Institute of Electrical and Micro Engineering (IEM), Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Neuchâtel, Switzerland

2. CSEM, Sustainable Energy Center, Neuchâtel, Switzerland

Abstract

The migration of mobile ions in the plane of the substrate is shown to have important effects on device behaviour and stability, especially near electrode boundaries.

Funder

Bundesamt für Energie

Board of the Swiss Federal Institutes of Technology

Marie Sklodowska-Curie Actions

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

European Commission

Publisher

Royal Society of Chemistry (RSC)

Subject

Pollution,Nuclear Energy and Engineering,Renewable Energy, Sustainability and the Environment,Environmental Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2022/EE/D2EE02330J