Twist angle-dependent interlayer hybridized exciton lifetimes in van der Waals heterostructures

Author:

Chen Shihong1,Sun Zejun2,Liu Huan2,Xu Haowen3,Wang Chong2,Han Rui2,Wang Zihao1,Huang Shuchun2,Zhao Xiaoliang1,Chen Zekai4,Li Weizhou5,Liu Dameng2ORCID

Affiliation:

1. School of Resources, Environment and Materials, Guangxi University, Guangxi, Nanning 530004, P.R. China

2. State Key Laboratory of Tribology in Advanced Equipment, Department of Mechanical Engineering, Tsinghua University, Beijing 100084, China

3. Institue for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing, China

4. Department of Electrical and Computer Engineering, Johns Hopkins University, 3400 North Charles Street, Baltimore, MD 21218, USA

5. School of Materials Science and Engineering, Xiamen University of Technology, Xiamen 361024, P.R. China

Abstract

The interlayer twist angle has a direct effect on exciton lifetimes in van der Waals heterostructures.

Funder

National Natural Science Foundation of China

Publisher

Royal Society of Chemistry (RSC)

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