A controllable and efficient method for the fabrication of a single HfC nanowire field-emission point electron source aided by low keV FIB milling-Reference-Cited by-同舟云学术

A controllable and efficient method for the fabrication of a single HfC nanowire field-emission point electron source aided by low keV FIB milling

Published:2020 Issue:32 Volume:12 Page:16770-16774
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Tang Shuai¹²³,Tang Jie¹²³⁴⁵^ORCID,Chiu Ta-Wei¹²³⁴⁵,Uzuhashi Jun¹²³,Tang Dai-Ming¹²³^ORCID,Ohkubo Tadakatsu¹²³,Mitome Masanori¹²³^ORCID,Uesugi Fumihiko¹²³,Takeguchi Masaki¹²³,Qin Lu-Chang⁶⁷⁸⁹^ORCID

Affiliation:

1. National Institute for Materials Science

2. Tsukuba

3. Japan

4. Graduate School of Pure and Applied Sciences

5. University of Tsukuba

6. Department of Physics and Astronomy

7. University of North Carolina at Chapel Hill

8. Chapel Hill

9. USA

Abstract

A high-performance single hafnium carbide (HfC) nanowire field-induced electron emitter, sharpened with focused ion beam (FIB), is characterized by electron microscopy, atom probe tomography, and field-emission measurement.

Funder

Ministry of Education, Culture, Sports, Science and Technology

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2020/NR/D0NR03406A

Reference18 articles.

1. Melting point in systems ZrC-HfC, TaC-ZrC, TaC-HfC

2. Electrical properties of hard materials

3. Mechanical, Thermal, and Oxidation Properties of Refractory Hafnium and zirconium Compounds