Physical property exploration of highly oriented V2O5 thin films prepared by electron beam evaporation-Reference-Cited by-同舟云学术

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Physical property exploration of highly oriented V2O5 thin films prepared by electron beam evaporation

Published:2015 Issue:12 Volume:39 Page:9471-9479
ISSN:1144-0546
Container-title:New Journal of Chemistry
language:en
Short-container-title:New J. Chem.

Author:

Thiagarajan Shrividhya¹²³⁴,Thaiyan Mahalingam⁵⁶⁷⁸,Ganesan Ravi¹²³⁴

Affiliation:

1. School of Physics

2. Alagappa University

3. Karaikudi

4. India-630004

5. Department of Electrical and Computer Engineering

6. Ajou University

7. Suwon 443749

8. South Korea

Abstract

Highly crystalline α-V₂O₅ thin film nanostructures with a single phase exhibiting higher mobility were prepared by the EB-PVD technique.

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry,Catalysis

Link

http://pubs.rsc.org/en/content/articlepdf/2015/NJ/C5NJ01582K

Reference58 articles.

1. Oxide electrochromics: An introduction to devices and materials

2. Trap densities and transport properties of pentacene metal-oxide-semiconductor transistors. I. Analytical modeling of time-dependent characteristics

3. Magnetic properties of vanadium oxide nanotubes and nanolayers

4. Correlation between metal-insulator transition characteristics and electronic structure changes in vanadium oxide thin films

5. Metal-insulator transitions

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