Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique-Reference-Cited by-同舟云学术

Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

Published:2023 Issue:9 Volume:15 Page:4277-4281
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Yu Lei¹²^ORCID,Zhang Mingyang¹²,Chen Haijian¹²,Xiao Bohuai¹²,Chang Shuai¹²^ORCID

Affiliation:

1. The State Key Laboratory of Refractories and Metallurgy, Wuhan University of Science and Technology, Wuhan, Hubei 430081, China

2. The Institute of Advanced Materials and Nanotechnology, Wuhan University of Science and Technology, Wuhan, Hubei 430081, China

Abstract

A fixed nanogap between electrodes is pre-set and the simultaneous electrical and mechanical properties of a single molecule are obtained from the time-resolved changes in both the current and force induced by stochastic metal–molecule binding.

Funder

Outstanding Young and Middle-aged Scientific Innovation Team of Colleges and Universities of Hubei Province

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2023/NR/D2NR06074D

Reference29 articles.

1. Measurements of Single-Molecule Electromechanical Properties

2. Tuning the Electromechanical Properties of Single DNA Molecular Junctions

3. An Electromechanical Approach to Understanding Binding Configurations in Single-Molecule Devices

4. Linker Dependent Bond Rupture Force Measurements in Single-Molecule Junctions

5. Simultaneous Electrical and Mechanical Characterization of Single-Molecule Junctions Using AFM-BJ Technique

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