2018 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications

Author:

Vanhoof Christine123,Bacon Jeffrey R.4,Ellis Andrew T.54,Vincze Laszlo6783,Wobrauschek Peter910

Affiliation:

1. Flemish Institute for Technological Research (VITO)

2. 2400 Mol

3. Belgium

4. UK

5. Abingdon

6. Ghent University

7. Department of Chemistry

8. B-9000 Ghent

9. Vienna University of Technology

10. Austria

Abstract

This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

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