Chemical and mechanical strains tuned dielectric properties in Zr-doped CaCu3Ti4O12 highly epitaxial thin films-Reference-Cited by-同舟云学术

Chemical and mechanical strains tuned dielectric properties in Zr-doped CaCu3Ti4O12 highly epitaxial thin films

Author:

Gao M.¹²³⁴,Feng D.¹²³⁴,Yao G.¹²³⁴,Zhang Y.¹²³⁴,Chen C.-L.⁵⁶⁷⁸⁹,Lin Y.¹²³⁴¹⁰

Affiliation:

1. State Key Laboratory of Electronic Thin Films and Integrated Devices

2. University of Electronic Science and Technology of China

3. Chengdu

4. P. R. China

5. Department of Physics and Astronomy

6. University of Texas at San Antonio

7. San Antonio

8. USA

9. Department of Physics and The Texas Center for Superconductivity

10. Institute of Electronic and Information Engineering in Dongguan

Abstract

The dielectric properties of CaCu₃Ti₄O₁₂ highly epitaxial thin films were successfully tuned by the in-plane strain.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

Link

Reference20 articles.

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