Microscopic origin of highly enhanced current carrying capabilities of thin NdFeAs(O,F) films

Author:

Kauffmann-Weiss Sandra1234ORCID,Iida Kazumasa56789ORCID,Tarantini Chiara1011121314ORCID,Boll Torben15216417,Schneider Reinhard182194,Ohmura Taito9678,Matsumoto Takuya5678,Hatano Takafumi56789,Langer Marco1234,Meyer Sven1234,Jaroszynski Jan1011121314,Gerthsen Dagmar182194,Ikuta Hiroshi56789,Holzapfel Bernhard1234,Hänisch Jens1234ORCID

Affiliation:

1. Institute for Technical Physics (ITEP)

2. Karlsruhe Institute of Technology (KIT)

3. 76344 Eggenstein-Leopoldshafen

4. Germany

5. Department of Materials Physics

6. Nagoya University

7. Nagoya 464-8603

8. Japan

9. Department of Crystalline Materials Science

10. Applied Superconductivity Center

11. National High Magnetic Field Laboratory

12. Florida State University

13. Tallahassee

14. USA

15. Karlsruhe Nano Micro Facility (KNMF)

16. Eggenstein-Leopoldshafen

17. Institute for Applied Materials (IAM-WK)

18. Laboratory for Electron Microscopy (LEM)

19. 76131 Karlsruhe

Abstract

The physical properties of FBS depend strongly on crystal structure, chemical composition and microstructure.

Funder

Japan Society for the Promotion of Science

Japan Science and Technology Agency

National Science Foundation

High Energy Physics

Publisher

Royal Society of Chemistry (RSC)

Subject

General Engineering,General Materials Science,General Chemistry,Atomic and Molecular Physics, and Optics,Bioengineering

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