Rapid, molecule-free, in situ rare earth element abundances by SIMS-SSAMS
Author:
Affiliation:
1. Materials Science and Technology Division
2. U.S. Naval Research Laboratory
3. Washington
4. USA
5. Microscopy & Surface Analysis
6. Corning, Inc.
7. Corning
8. Department of the Geophysical Sciences
9. University of Chicago
10. Chicago
Abstract
We present a novel method for rapid and high-sensitivity in situ measurements of the rare earth elements (REEs) by combined secondary ion mass spectrometry and single-stage accelerator mass spectrometry (SIMS-SSAMS).
Funder
U.S. Naval Research Laboratory
Office of Naval Research
Publisher
Royal Society of Chemistry (RSC)
Subject
Spectroscopy,Analytical Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2017/JA/C7JA00294G
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