Recent advances in hybrid measurement methods based on atomic force microscopy and surface sensitive measurement techniques-Reference-Cited by-同舟云学术

Recent advances in hybrid measurement methods based on atomic force microscopy and surface sensitive measurement techniques

Published:2017 Issue:75 Volume:7 Page:47464-47499
ISSN:2046-2069
Container-title:RSC Adv.
language:en
Short-container-title:RSC Adv.

Author:

Handschuh-Wang Stephan¹²³⁴,Wang Tao⁵⁶⁷⁸⁴,Zhou Xuechang¹²³⁴^ORCID

Affiliation:

1. College of Chemistry and Environmental Engineering

2. Shenzhen University

3. Shenzhen 518060

4. P. R. China

5. Functional Thin Films Research Center

6. Shenzhen Institutes of Advanced Technology

7. Chinese Academy of Sciences

8. Shenzhen 518055

Abstract

This review summaries the recent progress of the combination of optical and non-optical surface sensitive techniques with the atomic force microscopy.

Funder

National Natural Science Foundation of China

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2017/RA/C7RA08515J

Reference415 articles.

1. Simultaneous Nanomechanical and Electrochemical Mapping: Combining Peak Force Tapping Atomic Force Microscopy with Scanning Electrochemical Microscopy

2. Elucidating the nanoscale origins of organic electronic function by conductive atomic force microscopy

3. Microfluidic Patterning of Metal Structures for Flexible Conductors by In Situ Polymer-Assisted Electroless Deposition

4. An investigation on linear and non-linear optical constants of nano-spherical CuPc thin films for optoelectronic applications

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