Single shot laser ablation MC-ICP-MS for depth profile analysis of U isotopes in UO2 single crystals-Reference-Cited by-同舟云学术

Single shot laser ablation MC-ICP-MS for depth profile analysis of U isotopes in UO2 single crystals

Published:2019 Issue:10 Volume:34 Page:1965-1974
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Krachler M.¹²³^ORCID,Bulgheroni A.¹²³,Martinez Ferri A. I.¹²³,Ma Y.⁴⁵⁶⁷⁸,Miard A.⁴⁵⁶⁷⁸,Garcia Ph.⁴⁵⁶⁷⁸

Affiliation:

1. European Commission – Joint Research Centre Karlsruhe

2. D-76125 Karlsruhe

3. Germany

4. CEA

5. DEN

6. DEC

7. Centre de Cadarache

8. France

Abstract

Depth profiling of the n(²³⁵U)/n(²³⁸U) amount ratio in UO₂ single crystals employing LA-MC-ICP-MS, a dual beam focused ion beam and confocal laser scanning profilometry.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2019/JA/C9JA00212J

Reference26 articles.

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2. Capabilities of Femtosecond Laser Ablation Inductively Coupled Plasma Mass Spectrometry for Depth Profiling of Thin Metal Coatings

3. Femtosecond laser ablation inductively coupled plasma mass spectrometry: Fundamentals and capabilities for depth profiling analysis

4. Thickness Determination of Subnanometer Layers Using Laser Ablation Inductively Coupled Plasma Mass Spectrometry

5. High-Resolution Chemical Depth Profiling of Solid Material Using a Miniature Laser Ablation/Ionization Mass Spectrometer

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