Applications of spark-source mass spectrometry in the analysis of semiconductor materials. A review-Reference-Cited by-同舟云学术

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Applications of spark-source mass spectrometry in the analysis of semiconductor materials. A review

Published:1986 Issue:6 Volume:1 Page:411
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Verlinden Jozef,Gijbels Renaat,Adams Freddy

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/1986/JA/JA9860100411

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Anorganische Massenspektrometrie;Massenspektrometrie;2013

3. Mass Spectrometry in Semiconductor Research;Mass Spectrometry Handbook;2012-05-21

4. Inorganic Mass Spectrometry;Mass Spectrometry;2010-12-15

5. Mass Spectrometry;digital Encyclopedia of Applied Physics;2009-12-15

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