Auger electron angular distributions following excitation or ionization from the Xe 3d and F 1s levels in xenon difluoride

Author:

Forbes Ruaridh1ORCID,Hockett Paul2ORCID,Powis Ivan3ORCID,Bozek John D.4ORCID,Pratt Stephen T.5ORCID,Holland David M. P.6ORCID

Affiliation:

1. PULSE Institute, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA

2. National Research Council of Canada, 100 Sussex Dr. Ottawa, ON K1A 0R6, Canada

3. School of Chemistry, University of Nottingham, Nottingham NG7 2RD, UK

4. Synchrotron SOLEIL, l'Orme des Merisiers, Saint-Aubin, BP 48, 91192 Gif-sur-Yvette, France

5. Chemical Sciences and Engineering Division, Argonne National Laboratory, Lemont, IL 60439, USA

6. Daresbury Laboratory, Daresbury, Warrington, Cheshire WA4 4AD, UK

Abstract

Electron spectroscopy following Xe 3d and F 1s ionization in XeF2 elucidates the influence of core electrons on molecular bonding.

Funder

Science and Technology Facilities Council

U.S. Department of Energy

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Dissociation following the Auger decay of xenon difluoride molecules;The Journal of Chemical Physics;2024-01-09

2. Trends in angle-resolved molecular photoelectron spectroscopy;Physical Chemistry Chemical Physics;2022

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