The effects of CTAB concentration on the properties of electrodeposited cadmium telluride films-Reference-Cited by-同舟云学术

The effects of CTAB concentration on the properties of electrodeposited cadmium telluride films

Published:2014 Issue:24 Volume:16 Page:5227-5233
ISSN:1466-8033
Container-title:CrystEngComm
language:en
Short-container-title:CrystEngComm

Author:

Li Qian¹²³,Fu Wuyou¹²³,Mu Yannan¹²³⁴⁵,Zhang Wenjiao¹²³,Lv Pin¹²³,Zhou Liying¹²³,Yang Haibin¹²³,Chi Kailin¹²³,Yang Lihua¹²³

Affiliation:

1. State key Laboratory of Superhard Materials

2. Jilin University

3. Changchun, PR China

4. Department of Physics and Chemistry

5. Heihe University

Abstract

The effects of cetyltrimethylammonium bromide (CTAB) concentrations on the properties of electrochemically deposited cadmium telluride films have been investigated using SEM, EDX, XRD and photoelectrochemical measurements.

Publisher

Royal Society of Chemistry (RSC)

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2014/CE/C3CE42589D

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