Sample-standard interaction during trace analysis of semiconductor-grade trimethylindium by inductively coupled plasma atomic emission spectrometry
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Published:1999
Issue:5
Volume:14
Page:839-844
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ISSN:0267-9477
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Container-title:Journal of Analytical Atomic Spectrometry
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language:
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Short-container-title:J. Anal. At. Spectrom.
Author:
Gupta Rajesh K.,Al-Ammar Assad,Barnes Ramon M.
Publisher
Royal Society of Chemistry (RSC)
Subject
Spectroscopy,Analytical Chemistry