Photo induced force microscopy: chemical spectroscopy beyond the diffraction limit-Reference-Cited by-同舟云学术

Photo induced force microscopy: chemical spectroscopy beyond the diffraction limit

Published:2022 Issue:12 Volume:6 Page:1552-1573
ISSN:2052-1537
Container-title:Materials Chemistry Frontiers
language:en
Short-container-title:Mater. Chem. Front.

Author:

Davies-Jones Josh A.¹^ORCID,Davies Philip R.¹^ORCID

Affiliation:

1. Cardiff Catalysis Institute, School of Chemistry, Cardiff University, Cardiff, CF10 3AT, UK

Abstract

Over the last decade remarkable advances have been made in creating spectroscopic tools to interrogate surface properties using electromagnetic radiation in the near field, achieving lateral resolutions in the nanometre range.

Funder

Engineering and Physical Sciences Research Council

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2022/QM/D2QM00040G

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