Soluble polycyclosilane–polysiloxane hybrid material and silicon thin film with optical properties at 193 nm and etch selectivity

Author:

Park Sung Jin12345,Cho Hyeon Mo6478,Lee Myong Euy12345,Kim Miyoung910118,Han Kwenwoo910118,Hong Seunghee910118,Lim Sanghak910118,Lee Hansong910118,Hwang Byeonggyu910118,Kim Sang Kyun910118,Shim Sangdeok1213148,Kang Philjae154168,Choi Moon-Gun154168

Affiliation:

1. Department of Chemistry & Medical Chemistry

2. College of Science and Technology

3. Research & Education Center for Advanced Silicon Materials

4. Yonsei University

5. Wonju

6. University College

7. Incheon 406-840

8. Republic of Korea

9. Process Materials Development Team

10. Samsung SDI Co.

11. Suwon

12. Department of Chemistry

13. Sunchon National University

14. Sunchon

15. Department of Chemistry and Molecular Structure Laboratory

16. Seoul

Abstract

Silicon thin films that fulfil the needs of current semiconductor lithography were prepared from a new class of polycyclosilane–polysiloxane hybrid materials.

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

Reference35 articles.

1. K. Seshan , Handbook of Thin Film Deposition, Elsevier Science, 2012

2. G. Harbeke and M. J.Schulz, Semiconductor Silicon: Materials Science and Technology, Springer, London, 2011

3. B. G. Yacobi , Semiconductor Materials: An Introduction to Basic Principles, Kluwer Academic/Plenum Publishers, 2003

4. R. E. Hummel and K. H.Guenther, Handbook of Optical Properties: Thin Films for Optical Coatings, Taylor & Francis, 1995

5. Materials for and performance of multilayer lithography schemes

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