Study of the layer thickness of multilayer sample by the LIBS method based on ablation rate correction

Author:

Liu Shiming1,Li Cong1ORCID,He Qi1,Wu Huace1,Hu Xiaohan1,Men Boliang1,Wu Ding1ORCID,Hai Ran1ORCID,Wu Xingwei1,Ding Hongbin1ORCID

Affiliation:

1. Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), School of Physics, Dalian University of Technology, Dalian 116024, People's Republic of China

Abstract

As a remote and in situ diagnostic technique for the first wall of tokamaks, laser-induced breakdown spectroscopy (LIBS) has shown promising potential for depth profile analysis of deposition layers on plasma-facing components (PFCs).

Funder

National Natural Science Foundation of China

Natural Science Foundation of Liaoning Province

Publisher

Royal Society of Chemistry (RSC)

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