An investigation on focused electron/ion beam induced degradation mechanisms of conjugated polymers-Reference-Cited by-同舟云学术

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An investigation on focused electron/ion beam induced degradation mechanisms of conjugated polymers

Published:2011 Issue:45 Volume:13 Page:20235
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Sezen Meltem,Plank Harald,Fisslthaler Evelin,Chernev Boril,Zankel Armin,Tchernychova Elena,Blümel Alexander,List Emil J. W.,Grogger Werner,Pölt Peter

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2011/CP/C1CP22406A

Reference15 articles.

1. History, present status and future of the contribution of high-voltage electron microscopy to the study of radiation damage and defects in solids

2. Radiation damage and electron microscopy of organic polymers

3. Direct observation of radical formation by charge recombination

4. Beam damage of polypropylene in the environmental scanning electron microscope: an FTIR study

5. Radiation resistance of polymer materials

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