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X-ray fluorescence spectrometry

Published:1999 Issue:11 Volume:14 Page:1773-1799
ISSN:0267-9477
Container-title:J. Anal. At. Spectrom.
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

J. Potts Philip,T. Ellis Andrew,Kregsamer Peter,Streli Christina,West Margaret,Wobrauschek Peter

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/1999/JA/A907571B

Reference487 articles.

1. X-ray Spectrometry

2. S. Uhlig , J. M.Rincon(Ed.) and M.Romero(Ed.), Recent advances in X-ray fluorescence (XRF) analysis. Charact. Tech. Glasses Ceram., Springer, Berlin, Germany, 1999, 187–198

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3. Surface and Thin-Film Analysis, 4 Photon Detection;Ullmann's Encyclopedia of Industrial Chemistry;2011-10-15

4. Total-Reflection X-Ray Fluorescence (TXRF) Analysis;Surface and Thin Film Analysis;2011-04-12

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