Optomechanical resonating probe for very high frequency sensing of atomic forces-Reference-Cited by-同舟云学术

Optomechanical resonating probe for very high frequency sensing of atomic forces

Published:2020 Issue:5 Volume:12 Page:2939-2945
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Allain Pierre Etienne¹²³⁴⁵,Schwab Lucien⁶⁷⁸⁹⁵,Mismer Colin¹⁰¹¹¹²¹³¹⁴,Gely Marc¹⁵¹⁶¹⁷¹⁸⁵,Mairiaux Estelle¹⁹²⁰⁵,Hermouet Maxime¹⁵¹⁶¹⁷¹⁸⁵,Walter Benjamin¹⁹²⁰⁵,Leo Giuseppe¹²³⁴⁵,Hentz Sébastien¹⁵¹⁶¹⁷¹⁸⁵^ORCID,Faucher Marc¹⁰¹¹¹²¹³¹⁴^ORCID,Jourdan Guillaume¹⁵¹⁶¹⁷¹⁸⁵^ORCID,Legrand Bernard⁶⁷⁸⁹⁵^ORCID,Favero Ivan¹²³⁴⁵^ORCID

Affiliation:

1. Matériaux et Phénomènes Quantiques

2. Université de Paris

3. CNRS UMR 7162

4. Paris

5. France

6. Laboratoire d'Analyse et d'Architecture des Systèmes

7. CNRS UPR 8001

8. Université de Toulouse

9. Toulouse

10. Institut d'Electronique

11. de Microélectronique et de Nanotechnologie

12. Université de Lille, Centrale Lille, ISEN, Université Polytechnique Hauts-de-France

13. CNRS UMR 8520

14. Lille

15. Université Grenoble Alpes

16. CEA

17. LETI

18. Grenoble

19. Vmicro SAS

20. Villeneuve d'Ascq

Abstract

An optomechanical probe is introduced that operates at very high frequency, opening up a pathway to the measurement of atomic forces at shorter timescale.

Funder

Agence Nationale de la Recherche

H2020 European Research Council

European Commission

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2020/NR/C9NR09690F

Reference38 articles.

1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy