Direct characterization of intrinsic defects in monolayer ReSe2 on graphene

Author:

Lam Nguyen Huu1,Ko Jae-Hyeok2ORCID,Choi Byoung Ki34,Ly Trinh Thi156,Lee Giyeok2ORCID,Jang Kyuha7,Chang Young Jun48ORCID,Soon Aloysius2ORCID,Kim Jungdae1ORCID

Affiliation:

1. Department of Physics, University of Ulsan, Ulsan 44610, Republic of Korea

2. Department of Materials Science and Engineering and Center for Artificial Synesthesia Materials Discovery, Yonsei University, Seoul 03722, Republic of Korea

3. Advanced Light Source (ALS), E. O. Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

4. Department of Physics, University of Seoul, Seoul 02504, Republic of Korea

5. Vietnam National University, Ho Chi Minh City 700000, Vietnam

6. Faculty of Physics and Engineering Physics, University of Science, Ho Chi Minh City 700000, Vietnam

7. Radiation Center for Ultrafast Science, Korea Atomic Energy Research Institute, Daejeon 34057, Republic of Korea

8. Department of Smart Cities, University of Seoul, Seoul 02504, Republic of Korea

Abstract

By establishing a close collaboration between high-resolution STM/STS experiments and advanced STM models, we elucidate how intrinsic defects influence the electronic properties of monolayer ReSe2 on graphene.

Funder

National Research Foundation of Korea

Ministry of Science and ICT, South Korea

University of Seoul

Publisher

Royal Society of Chemistry (RSC)

Subject

General Engineering,General Materials Science,General Chemistry,Atomic and Molecular Physics, and Optics,Bioengineering

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3