Analytical models representing X-ray form factors of ions-Reference-Cited by-同舟云学术

Analytical models representing X-ray form factors of ions

Published:2024-01-01 Issue:1 Volume:80 Page:129-136
ISSN:2053-2733
Container-title:Acta Crystallographica Section A Foundations and Advances
language:
Short-container-title:Acta Crystallogr A Found Adv

Author:

Thorkildsen Gunnar^ORCID

Abstract

Parameters in analytical models for X-ray form factors of ions f 0(s), based on the inverse Mott–Bethe formula involving a variable number of Gaussians, are determined for a wide range of published data sets {s, f 0(s)}. The models reproduce the calculated form-factor values close to what is expected from a uniform statistical distribution with limits determined by their precision. For different ions associated with the same atom, the number of Gaussians in the models decreases with increasing net positive charge.

Publisher

International Union of Crystallography (IUCr)

Link

https://journals.iucr.org/a/issues/2024/01/00/ae5139/ae5139.pdf

Reference20 articles.

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