Characterization of pyramidal inversion boundaries in Sb2O3-doped ZnO by using electron back-scattered diffraction (EBSD)-Reference-Cited by-同舟云学术

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Characterization of pyramidal inversion boundaries in Sb2O3-doped ZnO by using electron back-scattered diffraction (EBSD)

Published:2007-04-13 Issue:3 Volume:63 Page:229-233
ISSN:0108-7673
Container-title:Acta Crystallographica Section A Foundations of Crystallography
language:
Short-container-title:Acta Cryst Sect A

Author:

Jo Wook,Park Chan,Kim Doh-Yeon

Publisher

International Union of Crystallography (IUCr)

Subject

Structural Biology

Link

http://journals.iucr.org/a/issues/2007/03/00/au5051/au5051.pdf

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Local structure change evidenced by temperature-dependent elastic measurements: Case study on Bi1/2Na1/2TiO3-based lead-free relaxor piezoceramics;Journal of Applied Physics;2014-02-28

2. Stable p-Type Conduction from Sb-Decorated Head-to-Head Basal Plane Inversion Domain Boundaries in ZnO Nanowires;Nano Letters;2012-02-02

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