Polarization-dependent X-ray six-beam pinhole topographs for a channel-cut silicon crystal
Author:
Publisher
International Union of Crystallography (IUCr)
Subject
Structural Biology
Link
http://journals.iucr.org/a/issues/2011/06/00/wo5004/wo5004.pdf
Reference23 articles.
1. Symmetrical cases of simultaneous X-ray diffraction and the Borrmann effect. I. The analysis of photoelectric absorption
2. Authier, A. (2005). Dynamical Theory of X-ray Diffraction, reprinted with revisions 2004, 2005. Oxford University Press.
3. Six-Beam X-Ray Diffraction in Ge Single Crystals
4. Die Absorption der Röntgenstrahlen im Dreistrahlfall der Interferenz
5. Multiple diffraction of X-rays and the phase problem. Computational procedures and comparison with experiment
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1. Experimentally obtained and computer-simulated X-ray asymmetric eight-beam pinhole topographs for a silicon crystal;Acta Crystallographica Section A Foundations and Advances;2019-04-30
2. Six-wave diffraction of X-rays in double-block crystal system;Journal of Contemporary Physics (Armenian Academy of Sciences);2017-01
3. Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I;Acta Crystallographica Section A Foundations and Advances;2016-03-30
4. Computer-simulated X-ray three-beam pinhole topographs for spherical silicon crystals;Acta Crystallographica Section A Foundations of Crystallography;2011-10-18
5. On the polarization state of X-rays generated using a rotating four-quadrant X-ray phase retarder system;Acta Crystallographica Section A Foundations of Crystallography;2011-10-18
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