Triple-crystal diffraction studies on ion-implanted and other silicon crystals using a synchrotron source-Reference-Cited by-同舟云学术

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Triple-crystal diffraction studies on ion-implanted and other silicon crystals using a synchrotron source

Published:1988-11-01 Issue:6 Volume:44 Page:828-833
ISSN:0108-7673
Container-title:Acta Crystallographica Section A Foundations of Crystallography
language:
Short-container-title:Acta Cryst Sect A

Author:

Stevenson A. W.,Wilkins S. W.,Harada J.,Kashiwagura N.,Ohshima K.,Sakata M.

Publisher

International Union of Crystallography (IUCr)

Subject

Structural Biology

Link

http://journals.iucr.org/a/issues/1988/06/00/bw0502/bw0502.pdf

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Isomers of a Dibismuthane, R2Bi−BiR2 [R = 2,6-(Me2NCH2)2C6H3], and Unusual Reactions with Oxygen: Formation of [R2Bi]2(O2) and R‘R‘ ‘Bi [R‘ = 2-(Me2NCH2)-6-{Me2N(O)CH2}C6H3; R‘ ‘ = 2-(Me2NCH2)-6-{O(O)C}C6H3];Inorganic Chemistry;2006-02-09

2. Structural Chemistry of Bismuth Compounds. I. Organobismuth Derivatives;Chemical Reviews;1999-10-08

3. Direct measure of the phase shift of an x-ray beam;Journal of the Optical Society of America A;1996-06-01

4. Interpretation of the diffuse scattering close to Bragg peaks by X-ray topography;Journal of Applied Crystallography;1993-12-01

5. A new technique for the observation of X-ray CTR scattering by using an imaging plate detector;Journal of Applied Crystallography;1993-04-01

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