Electron beam–specimen interactions and their effect on high-angle annular dark-field imaging of dopant atoms within a crystal
Author:
Publisher
International Union of Crystallography (IUCr)
Subject
Structural Biology
Link
http://journals.iucr.org/a/issues/2010/03/00/tn5014/tn5014.pdf
Reference22 articles.
1. High-resolution detection of Au catalyst atoms in Si nanowires
2. Three-dimensional imaging of individual hafnium atoms inside a semiconductor device
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5. A Bloch wave analysis of optical sectioning in aberration-corrected STEM
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1. Bloch Waves;Electron Beam-Specimen Interactions and Simulation Methods in Microscopy;2018-04-16
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4. Direct observation of Cu, Zn cation disorder in Cu2 ZnSnS4 solar cell absorber material using aberration corrected scanning transmission electron microscopy;Progress in Photovoltaics: Research and Applications;2012-09-07
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