Author:
Guérin D. M. A.,Alvarez A. G.,Rebollo Neira L. E.,Plastino A.,Bonetto R. D.
Abstract
An information theory approach is devised in order to obtain crystallite size distributions from X-ray line broadening. The method is shown to be superior to those based on Fourier expansions, as illustrated by numerical examples and a realistic situation. The powder model of Warren and Averbach is considered, in which the sample is thought of as a 'column-like' structure of unit cells perpendicular to the diffraction plane. Errors in excess of 100% arise as a result of truncating the diffraction peak. It is shown that, with the present approach, the corresponding figure is reduced to 5%, which confirms the power of information theory, and makes this method especially convenient in those cases in which there are large overlaps between the tails of two diffraction peaks.
Publisher
International Union of Crystallography (IUCr)
Cited by
22 articles.
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