Influence of the incident beam on integrated intensities in X-ray energy-dispersive diffractometry-Reference-Cited by-同舟云学术

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Influence of the incident beam on integrated intensities in X-ray energy-dispersive diffractometry

Published:1978-01-01 Issue:1 Volume:34 Page:84-87
ISSN:0567-7394
Container-title:Acta Crystallographica Section A
language:
Short-container-title:Acta Cryst Sect A

Author:

Olsen J. S.,Buras B.,Jensen T.,Alstrup O.,Gerward L.,Selsmark B.

Publisher

International Union of Crystallography (IUCr)

Link

http://journals.iucr.org/a/issues/1978/01/00/a28320/a28320.pdf

Cited by 29 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Rietveld refinement of energy-dispersive synchrotron measurements;Zeitschrift für Kristallographie;2011-10-25

2. Back-reflection energy-dispersive X-ray diffraction: a novel diffraction technique with almost complete insensitivity to sample morphology;Journal of Applied Crystallography;2011-04-22

3. Characterization of breast tissue using energy-dispersive X-ray diffraction computed tomography;Applied Radiation and Isotopes;2010-10

4. Energy Dispersive X-ray Diffraction Method for Structural Characterization of Non-Crystalline Oxides;High Temperature Materials and Processes;2003-08

5. High-pressure vessel for elastic and inelastic x-ray diffraction experiments for liquids over a wide temperature range;Review of Scientific Instruments;2001

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