X-ray diffraction measurement of a single nanometre-sized particle levitated in air by an optical-trap sample holder

Abstract

A single-beam optical-trap sample holder for X-ray diffraction measurements with synchrotron radiation has been developed. The sample holder was used to obtain an X-ray diffraction image of a single ZnO particle levitated in air, without mechanical contact, by the optical gradient force exerted by a focused laser beam. The diffraction image showed a Debye ring pattern, which was similar to a powder diffraction pattern of an assemblage of ZnO particles. While the ZnO particle is held by the optical trap in air, it rotates irregularly. Therefore, the Debye ring pattern of the ZnO particle can be clearly obtained even if the ZnO particle is a single grain. Lattice parameters and crystallite size of the single ZnO particle were determined simultaneously. The lattice parameters were determined to be a = 3.2505 ± 0.0005 Å and c = 5.207 ± 0.006 Å, which are consistent with those of the assemblage of ZnO particles. The crystallite size determined by the Scherrer method was 193.4 ± 26.2 nm.