Author:
Sahle Ch. J.,Gerbon F.,Henriquet C.,Verbeni R.,Detlefs B.,Longo A.,Mirone A.,Lagier M.-C.,Otte F.,Spiekermann G.,Petitgirard S.
Abstract
A compact spectrometer for medium-resolution resonant and non-resonant X-ray emission spectroscopy in von Hámos geometry is described. The main motivation for the design and construction of the spectrometer is to allow for acquisition of non-resonant X-ray emission spectra while measuring non-resonant X-ray Raman scattering spectra at beamline ID20 of the European Synchrotron Radiation Facility. Technical details are provided and the performance and possible use of the spectrometer are demonstrated by presenting results of several X-ray spectroscopic methods on various compounds.
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Cited by
4 articles.
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