Abstract
A full-field coherent imaging approach suitable for hard X-rays based on a classical (i.e. Galilean) X-ray microscope is described. The method combines a series of low-resolution images acquired at different transverse lens positions into a single high-resolution image, overcoming the spatial resolution limit set by the numerical aperture of the objective lens. The optical principles of the approach are described, the successful reconstruction of simulated phantom data is demonstrated, and aspects of the reconstruction are discussed. The authors believe that this approach offers some potential benefits over conventional scanning X-ray ptychography in terms of spatial bandwidth and radiation dose rate.
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Cited by
5 articles.
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