Online dynamic flat-field correction for MHz microscopy data at European XFEL
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Published:2023-09-20
Issue:6
Volume:30
Page:1030-1037
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ISSN:1600-5775
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Container-title:Journal of Synchrotron Radiation
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language:
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Short-container-title:J Synchrotron Radiat
Author:
Birnsteinova SarlotaORCID, Ferreira de Lima Danilo E., Sobolev EgorORCID, Kirkwood Henry J.ORCID, Bellucci Valerio, Bean Richard J., Kim ChanORCID, Koliyadu Jayanath C. P., Sato TokushiORCID, Dall'Antonia Fabio, Asimakopoulou Eleni Myrto, Yao Zisheng, Buakor KhachiwanORCID, Zhang YuheORCID, Meents AlkeORCID, Chapman Henry N.ORCID, Mancuso Adrian P.ORCID, Villanueva-Perez PabloORCID, Vagovič Patrik
Abstract
The high pulse intensity and repetition rate of the European X-ray Free-Electron Laser (EuXFEL) provide superior temporal resolution compared with other X-ray sources. In combination with MHz X-ray microscopy techniques, it offers a unique opportunity to achieve superior contrast and spatial resolution in applications demanding high temporal resolution. In both live visualization and offline data analysis for microscopy experiments, baseline normalization is essential for further processing steps such as phase retrieval and modal decomposition. In addition, access to normalized projections during data acquisition can play an important role in decision-making and improve the quality of the data. However, the stochastic nature of X-ray free-electron laser sources hinders the use of standard flat-field normalization methods during MHz X-ray microscopy experiments. Here, an online (i.e. near real-time) dynamic flat-field correction method based on principal component analysis of dynamically evolving flat-field images is presented. The method is used for the normalization of individual X-ray projections and has been implemented as a near real-time analysis tool at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of EuXFEL.
Funder
HORIZON EUROPE European Innovation Council
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
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