Inversion model for extracting chemically resolved depth profiles across liquid interfaces of various configurations from XPS data: PROPHESY

Author:

Ozon MatthewORCID,Tumashevich KonstantinORCID,Lin Jack J.,Prisle Nønne L.ORCID

Abstract

PROPHESY, a technique for the reconstruction of surface-depth profiles from X-ray photoelectron spectroscopy data, is introduced. The inversion methodology is based on a Bayesian framework and primal-dual convex optimization. The acquisition model is developed for several geometries representing different sample types: plane (bulk sample), cylinder (liquid microjet) and sphere (droplet). The methodology is tested and characterized with respect to simulated data as a proof of concept. Possible limitations of the method due to uncertainty in the attenuation length of the photo-emitted electron are illustrated.

Funder

H2020 European Research Council

Academy of Finland

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Reference136 articles.

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