Author:
Cartier Sebastian,Kagias Matias,Bergamaschi Anna,Wang Zhentian,Dinapoli Roberto,Mozzanica Aldo,Ramilli Marco,Schmitt Bernd,Brückner Martin,Fröjdh Erik,Greiffenberg Dominic,Mayilyan Davit,Mezza Davide,Redford Sophie,Ruder Christian,Schädler Lukas,Shi Xintian,Thattil Dhanya,Tinti Gemma,Zhang Jiaguo,Stampanoni Marco
Abstract
MÖNCH is a 25 µm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron applications where currently the detector is the limiting factor,e.g.inelastic X-ray scattering, Laue diffraction and soft X-ray or high-resolution color imaging. Due to the small pixel pitch, the charge cloud generated by absorbed X-rays is shared between neighboring pixels for most of the photons. Therefore, at low photon fluxes, interpolation algorithms can be applied to determine the absorption position of each photon with a resolution of the order of 1 µm. In this work, the characterization results of one of the MÖNCH prototypes are presented under low-flux conditions. A custom interpolation algorithm is described and applied to the data to obtain high-resolution images. Images obtained in grating interferometry experiments without the use of the absorption grating G2are shown and discussed. Perspectives for the future developments of the MÖNCH detector are also presented.
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Cited by
51 articles.
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