Sub-nanometre quality X-ray mirrors created using ion beam figuring

Author:

Majhi Arindam,Shurvinton RileyORCID,Pradhan Paresh Chandra,Hand Matthew,Gu Weichen,Da Silva Murilo Bazan,Moriconi Simone,Nistea IoanaORCID,Alcock Simon G.ORCID,Wang Hongchang,Sawhney KawalORCID

Abstract

Ion beam figuring (IBF) is a powerful technique for figure correction of X-ray mirrors to a high accuracy. Here, recent technical advancements in the IBF instrument developed at Diamond Light Source are presented and experimental results for figuring of X-ray mirrors are given. The IBF system is equipped with a stable DC gridded ion source (120 mm diameter), a four-axis motion stage to manipulate the optic, a Faraday cup to monitor the ion-beam current, and a camera for alignment. A novel laser speckle angular measurement instrument also provides on-board metrology. To demonstrate the IBF system's capabilities, two silicon X-ray mirrors were processed. For 1D correction, a height error of 0.08 nm r.m.s. and a slope error of 44 nrad r.m.s. were achieved. For 2D correction over a 67 mm × 17 mm clear aperture, a height error of 0.8 nm r.m.s. and a slope error of 230 nrad r.m.s. were obtained. For the 1D case, this optical quality is comparable with the highest-grade, commercially available, X-ray optics.

Funder

Horizon 2020 Framework Programme

Publisher

International Union of Crystallography (IUCr)

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