Author:
Dakovski Georgi L.,Lin Ming-Fu,Damiani Daniel S.,Schlotter William F.,Turner Joshua J.,Nordlund Dennis,Ogasawara Hirohito
Abstract
A method for measuring resonant inelastic X-ray scattering based on the conversion of X-ray photons into photoelectrons is presented. The setup is compact, relies on commercially available detectors, and offers significant flexibility. This method is demonstrated at the Linac Coherent Light Source with ∼0.5 eV resolution at the cobaltL3-edge, with signal rates comparable with traditional grating spectrometers.
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Cited by
2 articles.
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