Author:
Liu Yi,Wang Ming,Wan Wenjie,Zhou Jianbin,Hong Xu,Liu Fei,Yu Jie
Abstract
Under the condition of high counting rate, the phenomenon of nuclear pulse signal pile-up using a single exponential impulse shaping method is still very serious, and leads to a severe loss in counting rate. A real nuclear pulse signal can be expressed as a dual-exponential decay function with a certain rising edge. This paper proposes a new dual-exponential impulse shaping method and shows its deployment in hardware to test its performance. The signal of a high-performance silicon drift detector under high counting rate in an X-ray fluorescence spectrometer is obtained. The result of the experiment shows that the new method can effectively shorten the dead-time caused by nuclear signal pile-up and correct the counting rate.
Funder
National Natural Science Foundation of China
Major science and technology projects of Sichuan Province
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Cited by
8 articles.
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