Abstract
In microscopy, there is a trade-off between the magnification and a workable field of view (FOV). In this paper, bent asymmetric diffraction wafers were used with a conventional X-ray source to accept high divergence and increase the FOV of a two-dimensional X-ray microscope. An FOV of 5 mm with 20× magnification was realized with two independent wafers in a thermomechanically stable setup. Using the knife-edge method, a resolution of 2.5 µm was measured in one dimension. The FOV of such a system is limited by the sizes of the wafers, and the magnification is limited only by the critical angle of external reflection.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
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1. X-ray microscope with refractive x-ray optics and microfocus laboratory source;Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI;2017-08-23