Abstract
A data analysis technique based on the Patterson function is tested with simulated X-ray reflectometry data. In comparison to the case for neutron reflectometry, additional data manipulation is required because the scattering-length density of materials is generally much higher for X-rays than for neutrons. With this extra step duly performed, the technique yields a model layer profile accurate enough for least-squares refinement.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology