Author:
Drnec Jakub,Zhou Tao,Pintea Stelian,Onderwaater Willem,Vlieg Elias,Renaud Gilles,Felici Roberto
Abstract
This article proposes two integration methods to determine the structure factors along a surface diffraction rod measured with a two-dimensional detector. The first method applies the classic way of calculating integrated intensities in angular space. This is adapted to work efficiently with two-dimensional data. The second method is based on integration in reciprocal space. An intensity map is created by converting the detected intensity pixel by pixel to the reciprocal space. The integration is then performed directly on this map. A theoretical framework, as well as a comparison between the two integration methods, is provided.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
37 articles.
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