Analysis of crystalline perfection of pure and Mo-doped KTP crystals on different growth planes by high-resolution X-ray diffraction

Abstract

Single crystals of pure and molybdenum (Mo)-doped potassium titanyl phosphate (KTP) crystals were grown by the high-temperature solution growth technique. The presence of dopant ions in the grown crystal was confirmed by energy-dispersive X-ray analysis. Grown crystals, cut along various growth planes such as (100), (011) or (201), were analysed for crystalline perfection using high-resolution X-ray diffraction (HRXRD). Although the HRXRD study showed that the crystalline perfection of most of the crystals was quite good without any structural defects, structural grain boundaries were observed in some of the crystals chosen for study. The observed structural defects are probably due to mechanical or thermal fluctuations occurring during the growth process.