Abstract
The theoretical background to the formation of interference fringes in a triple Laue X-ray interferometer by a specimen having plano-concave form is presented. The interference fringes in the general case have an elliptical form. The relation between the radius of the specimen, the refractive index and the radii of the interference fringes is established. For two epoxy lenses having different radii, the interference fringes are registered. The refractive index and the radii are determined by measuring the radii of the obtained interference fringes.
Publisher
International Union of Crystallography (IUCr)
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