Author:
Rowles Matthew R.,Buckley Craig E.
Abstract
The construction of peak intensity, profile and displacement aberration functions based on the geometry of a powder diffraction measurement allows for physically realistic corrections to be applied in Rietveld modelling through a fundamental parameters approach. Parallel-beam corrections for asymmetric reflection and Debye–Scherrer geometry are summarized, and corrections for thin-plate transmission are derived and validated. Geometrically correct implementations of preferred orientation models are also summarized.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
19 articles.
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